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Title: The direct injection of intense ion beams from a high field electron cyclotron resonance ion source into a radio frequency quadrupole

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.4861405· OSTI ID:22253573
;  [1];  [2];  [3];  [4]
  1. Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi (India)
  2. Institut fur Angewandte Physik der Universitaet, D-60054 Frankfurt/M (Germany)
  3. R and M Technical Enterprises, Inc., 4725 Arlene Place, Pleasanton, California 94566 (United States)
  4. Indira Gandhi Centre for Atomic Research, Kalpakkam, Tamilnadu (India)

The ion current achievable from high intensity ECR sources for highly charged ions is limited by the high space charge. This makes classical extraction systems for the transport and subsequent matching to a radio frequency quadrupole (RFQ) accelerator less efficient. The direct plasma injection (DPI) method developed originally for the laser ion source avoids these problems and uses the combined focusing of the gap between the ion source and the RFQ vanes (or rods) and the focusing of the rf fields from the RFQ penetrating into this gap. For high performance ECR sources that use superconducting solenoids, the stray magnetic field of the source in addition to the DPI scheme provides focusing against the space charge blow-up of the beam. A combined extraction/matching system has been designed for a high performance ECR ion source injecting into an RFQ, allowing a total beam current of 10 mA from the ion source for the production of highly charged {sup 238}U{sup 40+} (1.33 mA) to be injected at an ion source voltage of 60 kV. In this design, the features of IGUN have been used to take into account the rf-focusing of an RFQ channel (without modulation), the electrostatic field between ion source extraction and the RFQ vanes, the magnetic stray field of the ECR superconducting solenoid, and the defocusing space charge of an ion beam. The stray magnetic field is shown to be critical in the case of a matched beam.

OSTI ID:
22253573
Journal Information:
Review of Scientific Instruments, Vol. 85, Issue 2; Conference: ICIS 2011: 14. international conference on ion sources, Giardini-Naxos, Sicily (Italy), 12-16 Sep 2011; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English

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