Note: Long-range scanning tunneling microscope for the study of nanostructures on insulating substrates

Journal Article · Sat Feb 15 00:00:00 EST 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4864196· OSTI ID:22253545

Rodrigo, José G.; Island, Joshua; Burzuri, Enrique; Agraït, Nicolás ^[1]

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1. Departamento de Física de la Materia Condensada, Universidad Autónoma de Madrid, Campus de Cantoblanco, E-28049 Madrid (Spain)

The scanning tunneling microscope (STM) is a powerful tool for studying the electronic properties at the atomic level, however, it is of relatively small scanning range and the fact that it can only operate on conducting samples prevents its application to study heterogeneous samples consisting of conducting and insulating regions. Here we present a long-range scanning tunneling microscope capable of detecting conducting micro and nanostructures on insulating substrates using a technique based on the capacitance between the tip and the sample and performing STM studies.

• OSTI ID: 22253545
• Journal Information: Review of Scientific Instruments, Vol. 85, Issue 2; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CAPACITANCE
ELECTRICAL PROPERTIES
NANOSTRUCTURES
SCANNING TUNNELING MICROSCOPY
SUBSTRATES