Spatial spectrograms of vibrating atomic force microscopy cantilevers coupled to sample surfaces

Journal Article · Mon Dec 23 00:00:00 EST 2013 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4840116· OSTI ID:22253262

Wagner, Ryan; Raman, Arvind ^[1]; Proksch, Roger ^[2]

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1. Birck Nanotechnology Center, 1205 W. State Street, Purdue University, West Lafayette, Indiana 47907 (United States)
2. Asylum Research, 6310 Hollister Ave., Santa Barbara, California 93117 (United States)

Many advanced dynamic Atomic Force Microscopy (AFM) techniques such as contact resonance, force modulation, piezoresponse force microscopy, electrochemical strain microscopy, and AFM infrared spectroscopy exploit the dynamic response of a cantilever in contact with a sample to extract local material properties. Achieving quantitative results in these techniques usually requires the assumption of a certain shape of cantilever vibration. We present a technique that allows in-situ measurements of the vibrational shape of AFM cantilevers coupled to surfaces. This technique opens up unique approaches to nanoscale material property mapping, which are not possible with single point measurements alone.

• OSTI ID: 22253262
• Journal Information: Applied Physics Letters, Vol. 103, Issue 26; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

77 NANOSCIENCE AND NANOTECHNOLOGY
ABSORPTION SPECTROSCOPY
ATOMIC FORCE MICROSCOPY
ELECTROCHEMISTRY
INFRARED SPECTRA
MAPPING
NANOSTRUCTURES
SHAPE
SURFACES