Synthesis of endohedral iron-fullerenes by ion implantation

Journal Article · Sat Feb 15 00:00:00 EST 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4850756· OSTI ID:22253191

Minezaki, H.; Ishihara, S. ^[1]; Muramatsu, M.; Kitagawa, A. ^[2]; Rácz, R.; Biri, S. ^[3]; Asaji, T. ^[4]; Kato, Y. ^[5]; Yoshida, Y. ^[1]

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1. Graduate School of Engineering, Toyo University, 2100, Kujirai, Kawagoe, Saitama 350-8585 (Japan)
2. National Institute of Radiological Sciences (NIRS), 4-9-1, Anagawa, Inage-ku, Chiba-shi, Chiba 263-8555 (Japan)
3. Institute of Nuclear Research (ATOMKI), Bem tér 18/C, H-4026 Debrecen (Hungary)
4. Oshima National College of Maritime Technology, 1091-1, Komatsu Suou Oshima-city Oshima, Yamaguchi 742-2193 (Japan)
5. Graduate School of Engineering, Osaka University, 2-1, Yamada-oka, Suita-shi, Osaka 565-0871 (Japan)

In this paper, we discuss the results of our study of the synthesis of endohedral iron-fullerenes. A low energy Fe{sup +} ion beam was irradiated to C{sub 60} thin film by using a deceleration system. Fe{sup +}-irradiated C{sub 60} thin film was analyzed by high performance liquid chromatography and laser desorption/ ionization time-of-flight mass spectrometry. We investigated the performance of the deceleration system for using a Fe{sup +} beam with low energy. In addition, we attempted to isolate the synthesized material from a Fe{sup +}-irradiated C{sub 60} thin film by high performance liquid chromatography.

• OSTI ID: 22253191
• Journal Information: Review of Scientific Instruments, Vol. 85, Issue 2; Conference: ICIS 2011: 14. international conference on ion sources, Giardini-Naxos, Sicily (Italy), 12-16 Sep 2011; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ACCELERATION
DESORPTION
FULLERENES
HIGH-PERFORMANCE LIQUID CHROMATOGRAPHY
ION BEAMS
ION IMPLANTATION
IONIZATION
IRON IONS
IRRADIATION
LASERS
MASS SPECTROSCOPY
THIN FILMS
TIME-OF-FLIGHT METHOD