skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Microwave absorptions of ultrathin conductive films and designs of frequency-independent ultrathin absorbers

Journal Article · · AIP Advances
DOI:https://doi.org/10.1063/1.4863921· OSTI ID:22251590
; ; ; ; ;  [1];  [2]
  1. School of Physical Science and Technology, Soochow University, 1 Shizi Street, Suzhou 215006 (China)
  2. Institute of Modern Optical Technologies and Collaborative Innovation Center of Suzhou Nano Science and Technology, Jiangsu Key Lab of Advanced Optical Manufacturing Technologies, Soochow University, 1 Shizi Street, Suzhou 215006 (China)

We study the absorption properties of ultrathin conductive films in the microwave regime, and find a moderate absorption effect which gives rise to maximal absorbance 50% if the sheet (square) resistance of the film meets an impedance matching condition. The maximal absorption exhibits a frequency-independent feature and takes place on an extremely subwavelength scale, the film thickness. As a realistic instance, ∼5 nm thick Au film is predicted to achieve the optimal absorption. In addition, a methodology based on metallic mesh structure is proposed to design the frequency-independent ultrathin absorbers. We perform a design of such absorbers with 50% absorption, which is verified by numerical simulations.

OSTI ID:
22251590
Journal Information:
AIP Advances, Vol. 4, Issue 1; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 2158-3226
Country of Publication:
United States
Language:
English

Similar Records

Maximal absorption in ultrathin TiN films for microbolometer applications
Journal Article · Tue Dec 06 00:00:00 EST 2022 · Applied Physics Letters · OSTI ID:22251590

Enhanced microwave-to-terahertz absorption in graphene
Journal Article · Mon Mar 21 00:00:00 EDT 2016 · Applied Physics Letters · OSTI ID:22251590

Conduction noise absorption by ITO thin films attached to microstrip line utilizing Ohmic loss
Journal Article · Thu Jul 15 00:00:00 EDT 2010 · Journal of Applied Physics · OSTI ID:22251590