Fast and gentle side approach for atomic force microscopy
Journal Article
·
· Review of Scientific Instruments
- Philips Innovation Services, High Tech Campus 7, 5656 AE Eindhoven (Netherlands)
Atomic force microscopy is one of the most popular imaging tools with atomic resolution in different research fields. Here, a fast and gentle side approach for atomic force microscopy is proposed to image the same surface location and to reduce the time delay between modification and imaging without significant tip degradation. This reproducible approach to image the same surface location using atomic force microscopy shortly after, for example, any biological, chemical, or physical modification on a geometrically separated position has the potential to become widely used.
- OSTI ID:
- 22251249
- Journal Information:
- Review of Scientific Instruments, Vol. 84, Issue 12; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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