Structural evolution of Ga-Ge-Te glasses by combined EXAFS and XPS analysis

Journal Article · Wed Aug 07 00:00:00 EDT 2013 · Journal of Chemical Physics

DOI:https://doi.org/10.1063/1.4817332· OSTI ID:22220486

Golovchak, R. ^[1]; Calvez, L.; Bureau, B. ^[2]; Jain, H. ^[3]

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1. Department of Physics and Astronomy, Austin Peay State University, Clarksville, Tennessee 37044 (United States)
2. Laboratoire des Verres et Ceramiques, Institut des Sciences Chimiques de Rennes, UMR-CNRS6226, University of Rennes 1 (France)
3. Materials Science and Engineering Department, Lehigh University, 5 East Packer Avenue, Bethlehem, Pennsylvania 18015 (United States)

The structural evolution of Ga{sub x}Ge{sub y}Te{sub 100−x−y} glasses in the vicinity of GeTe{sub 4}-GaTe{sub 3} pseudo-binary tie-line is determined with high-resolution X-ray photoelectron (XPS) and extended X-ray absorption fine structure (EXAFS) spectroscopies. The analysis of XPS data is complicated by similar electronegativity values for the constituent chemical elements, but then the interpretation is facilitated by information from complementary EXAFS analysis of the structure around each element independently. The results show 4/4/2 coordination for Ga/Ge/Te atoms and absence of Ga(Ge)-Ge(Ga) bonds or extended Te clusters in significant concentrations within the whole range of studied composition. The observed structural features correlate well with the measured basic physical properties of Ga-containing germanium telluride glasses.

• OSTI ID: 22220486
• Journal Information: Journal of Chemical Physics, Vol. 139, Issue 5; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-9606
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION
ABSORPTION SPECTROSCOPY
ELECTRONEGATIVITY
FINE STRUCTURE
GALLIUM COMPOUNDS
GERMANIUM TELLURIDES
GLASS
PHYSICAL PROPERTIES
X RADIATION
X-RAY PHOTOELECTRON SPECTROSCOPY
X-RAY SPECTROSCOPY