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Title: Compton scattering for spectroscopic detection of ultra-fast, high flux, broad energy range X-rays

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.4825374· OSTI ID:22220322
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  1. Scottish Universities Physics Alliance, Department of Physics, University of Strathclyde, John Anderson Building, 107 Rottenrow, Glasgow G4 0NG (United Kingdom)
  2. Scottish Universities Physics Alliance, School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ (United Kingdom)
  3. GoLP/Instituto de Plasmas eFusão Nuclear, Instituto Superior Técnico, Universidade de Lisboa, Avenida Rovisco Pais, 1049-001 Lisbon (Portugal)
  4. Central Laser Facility, Science and Technology Facilities Council, Rutherford Appleton Laboratory, Harwell Science and Innovation Campus, OX11 0QX Didcot (United Kingdom)

Compton side-scattering has been used to simultaneously downshift the energy of keV to MeV energy range photons while attenuating their flux to enable single-shot, spectrally resolved, measurements of high flux X-ray sources to be undertaken. To demonstrate the technique a 1 mm thick pixelated cadmium telluride detector has been used to measure spectra of Compton side-scattered radiation from a Cobalt-60 laboratory source and a high flux, high peak brilliance X-ray source of betatron radiation from a laser-plasma wakefield accelerator.

OSTI ID:
22220322
Journal Information:
Review of Scientific Instruments, Vol. 84, Issue 11; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English