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Title: Modeling surface backgrounds from radon progeny plate-out

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4818117· OSTI ID:22218190
; ;  [1]
  1. University of South Dakota, Vermillion, South Dakota 57069 (United States)

The next generation low-background detectors operating deep underground aim for unprecedented low levels of radioactive backgrounds. The surface deposition and subsequent implantation of radon progeny in detector materials will be a source of energetic background events. We investigate Monte Carlo and model-based simulations to understand the surface implantation profile of radon progeny. Depending on the material and region of interest of a rare event search, these partial energy depositions can be problematic. Motivated by the use of Ge crystals for the detection of neutrinoless double-beta decay, we wish to understand the detector response of surface backgrounds from radon progeny. We look at the simulation of surface decays using a validated implantation distribution based on nuclear recoils and a realistic surface texture. Results of the simulations and measured α spectra are presented.

OSTI ID:
22218190
Journal Information:
AIP Conference Proceedings, Vol. 1549, Issue 1; Conference: LRT 2013: 4. international workshop on low radioactivity techniques, Assergi (Italy), 10-12 Apr 2013; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English