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Title: Orientation-dependent piezoelectric properties in lead-free epitaxial 0.5BaZr{sub 0.2}Ti{sub 0.8}O{sub 3}-0.5Ba{sub 0.7}Ca{sub 0.3}TiO{sub 3} thin films

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4821918· OSTI ID:22217960
 [1]; ;  [1];  [2]
  1. School of Materials Science and Engineering, The University of New South Wales, Sydney, NSW 2052 (Australia)
  2. School of Science, Northwestern Polytechnical University, Xi'an 710072 (China)

Orientation-engineered 0.5BaZr{sub 0.2}Ti{sub 0.8}O{sub 3}-0.5Ba{sub 0.7}Ca{sub 0.3}TiO{sub 3} (BZT-BCT) thin films were deposited on La{sub 0.7}Sr{sub 0.3}MnO{sub 3}-coated SrTiO{sub 3} single-crystalline (001), (110), and (111) substrates by off-axis radio-frequency magnetron sputtering. X-ray diffraction confirmed a highly epitaxial growth of all the as-deposited films. It is believed the strong orientation dependence of ferroelectric and piezoelectric properties on the films is attributed to the relative alignment of crystallites and spontaneous polarization vector. The optimal ferroelectric response lies in the [001] direction, whereas a comparatively large effective piezoelectric coefficient d{sub 33,eff} of 100.1 ± 5 pm/V was attained in [111] BZT-BCT thin film, suggesting its potential application for high-performance lead-free piezoelectric devices.

OSTI ID:
22217960
Journal Information:
Applied Physics Letters, Vol. 103, Issue 12; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English