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Title: Feasibility test of Z{sub eff} imaging using x-ray interferometry

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4831773· OSTI ID:22217814
 [1];  [2];  [3]
  1. Central Research Laboratory, Hitachi Ltd., 2520 Akanuma, Hatoyama 350-0395 (Japan)
  2. High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba 305-0801 (Japan)
  3. Allied Health Sciences and Graduate School of Medical Science, Kitasato University, 1-15-1 Kitasato, Minami-ku, Sagamihara 252-0373 (Japan)

Elemental imaging using X-ray interferometry has been developed. Since the atomic number (Z) of a single-element sample (effective atomic number (Z{sub eff}) for a plural-element sample) corresponds to the ratio of the real to imaginary part of the complex refractive index, an elemental map is calculable with the ratio of an absorption and phase-contrast image. Several metal foils underwent feasibility observations by crystal X-ray interferometry, providing accurate detection of X-ray intensity and phase-shift. The obtained Z{sub eff} image shows that aluminum, iron, nickel, and copper foil were clearly distinguished, and nickel and copper's Z{sub eff} values coincide with ideal Z number within 1%.

OSTI ID:
22217814
Journal Information:
Applied Physics Letters, Vol. 103, Issue 20; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English