skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Growth and characterization of Fe{sub 3}O{sub 4} films

Journal Article · · Materials Research Bulletin
;  [1]; ;  [2]; ;  [3];  [1]
  1. State Key Laboratory of Metal Matrix Composites, Shanghai Jiaotong University, Shanghai 200240 (China)
  2. Department of Materials Science and Engineering, Kyushu University, Fukuoka 819-0395 (Japan)
  3. Synchrotron Light Application Center, Department of Electrical and Electronic Engineering, Saga University, Saga 840-8502 (Japan)

Highlights: Black-Right-Pointing-Pointer Pulsed laser deposition is the promising technique for growing high quality single phase Fe{sub 3}O{sub 4}. Black-Right-Pointing-Pointer Crystal quality and magnetic properties of the Fe{sub 3}O{sub 4} films strongly depend on the substrate temperature during the growth. Black-Right-Pointing-Pointer Optimum of the substrate temperature leads high crystal quality of single phase Fe{sub 3}O{sub 4}. -- Abstract: Iron oxide films were grown on sapphire substrates by pulsed laser deposition at substrate temperatures between 100 and 700 Degree-Sign C. X-ray diffraction, Raman spectroscopy, and vibrational sample magnetometer analysis revealed that structural and magnetic properties of the iron oxide films strongly depend on the substrate temperature during growth. Single phase Fe{sub 3}O{sub 4} film was successfully grown on sapphire substrate at a substrate temperature of 500 Degree-Sign C. The saturation magnetic moment of the single phase Fe{sub 3}O{sub 4} film is 499 emu/cm{sup 3}, which is in good agreement with the value reported for bulk magnetite, suggesting the Fe{sub 3}O{sub 4} film is of high crystal quality without antiphase boundaries.

OSTI ID:
22212333
Journal Information:
Materials Research Bulletin, Vol. 46, Issue 12; Other Information: Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
Country of Publication:
United States
Language:
English