Effects of high energy x ray and proton irradiation on lead zirconate titanate thin films' dielectric and piezoelectric response

Journal Article · Mon May 13 00:00:00 EDT 2013 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4805045· OSTI ID:22162922

Bastani, Y.; Cortes-Pena, A. Y.; Wilson, A. D. ^[1]; Gerardin, S.; Bagatin, M.; Paccagnella, A. ^[2]; Bassiri-Gharb, N. ^[1]

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1. G.W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332 (United States)
2. DEI-Department of Information Engineering, University of Padova, Padova 35131 (Italy)

The effects of irradiation by X rays and protons on the dielectric and piezoelectric response of highly (100)-textured polycrystalline Pb(Zr{sub x}Ti{sub 1-x})O{sub 3} (PZT) thin films have been studied. Low-field dielectric permittivity, remanent polarization, and piezoelectric d{sub 33,f} response all degraded with exposure to radiation, for doses higher than 300 krad. At first approximation, the degradation increased at higher radiation doses, and was stronger in samples exposed to X rays, compared to the proton-irradiated ones. Nonlinear and high-field dielectric characterization suggest a radiation-induced reduction of the extrinsic contributions to the response, attributed to increased pinning of the domain walls by the radiation-induced point defects.

• OSTI ID: 22162922
• Journal Information: Applied Physics Letters, Vol. 102, Issue 19; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
APPROXIMATIONS
COMPARATIVE EVALUATIONS
FERROELECTRIC MATERIALS
IRRADIATION
LEAD COMPOUNDS
OZONE
PERMITTIVITY
PIEZOELECTRICITY
POINT DEFECTS
POLARIZATION
POLYCRYSTALS
PROTON BEAMS
PZT
RADIATION DOSES
TEXTURE
THIN FILMS
TITANATES
X RADIATION
ZIRCONATES