Quantitative analysis of annealed scanning probe tips using energy dispersive x-ray spectroscopy

Journal Article · Mon Jan 14 00:00:00 EST 2013 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4776705· OSTI ID:22162673

Cobley, R. J.; Brown, R. A.; Barnett, C. J.; Maffeis, T. G. G.; Penny, M. W. ^[1]

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1. Multidisciplinary Nanotechnology Centre, College of Engineering, Swansea University, Singleton Park, Swansea SA2 8PP (United Kingdom)

A quantitative method to measure the reduction in oxide species on the surface of electrochemically etched tungsten tips during direct current annealing is developed using energy dispersive x-ray spectroscopy. Oxide species are found to decrease with annealing current, with the trend repeatable over many tips and along the length of the tip apex. A linear resistivity approximation finds significant oxide sublimation occurs at 1714 K, but surface melting and tip broadening at 2215 K. This method can be applied to calibrate any similar annealing stage, and to identify the tradeoff regime between required morphological and chemical properties.

• OSTI ID: 22162673
• Journal Information: Applied Physics Letters, Vol. 102, Issue 2; Other Information: (c) 2013 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANNEALING
APPROXIMATIONS
CHEMICAL ANALYSIS
CHEMICAL PROPERTIES
DIRECT CURRENT
ELECTROCHEMISTRY
ETCHING
MELTING
SUBLIMATION
SURFACES
TEMPERATURE RANGE 1000-4000 K
TUNGSTEN
X RADIATION
X-RAY SPECTROSCOPY