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Title: Development of a coincidence system for the measurement of X-ray emission atomic parameters

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4813465· OSTI ID:22121601
;  [1]
  1. Instituto de Fisica, Universidad Nacional Autonoma de Mexico, Apartado Postal 20-364, 01000 Mexico, D.F (Mexico)

Preliminary results obtained in experiments carried out with an x-ray spectrometer built at the Instituto de Fisica for Atomic Physics and environmental sciences studies are presented. The experiments are based on a coincidence method for signals produced by LEGe and Si(Li) detectors. The x-ray fluorescence yields ({omega}{sub Li}) and Coster-Kronig transition probabilities (f{sub ij}) for elements with 55 {<=} Z {<=} 60 are among the quantities of interest. The method is based on the simultaneous detection of K x-rays with the LEGe detector and the L x-rays with the Si(Li) detector. The primary radiation source is an x-ray tube with Rh anode. The system was tested with the coincidence of the L x-rays from Ce with its K line, demonstrating the feasibility of the experiments.

OSTI ID:
22121601
Journal Information:
AIP Conference Proceedings, Vol. 1544, Issue 1; Conference: 9. international symposium on radiation physics, Puebla (Mexico), 14-17 Apr 2013; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English

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