PIXE simulation: Models, methods and technologies
- INFN Sezione di Genova, Via Dodecaneso 33, 16146 Genova, Italy and Jozef Stefan Institute, Jamova cesta 39, Ljubljana 1000 (Slovenia)
- INFN Sezione di Genova, Via Dodecaneso 33, 16146 Genova (Italy)
- Max-Planck-Institut Halbleiterlabor, Otto-Hahn-Ring 6, 81739 Muenchen (Germany) and Max-Planck-Institut fuer extraterrestrische Physik, Giessenbachstrasse, Garching 85748 (Germany)
The simulation of PIXE (Particle Induced X-ray Emission) is discussed in the context of general-purpose Monte Carlo systems for particle transport. Dedicated PIXE codes are mainly concerned with the application of the technique to elemental analysis, but they lack the capability of dealing with complex experimental configurations. General-purpose Monte Carlo codes provide powerful tools to model the experimental environment in great detail, but so far they have provided limited functionality for PIXE simulation. This paper reviews recent developments that have endowed the Geant4 simulation toolkit with advanced capabilities for PIXE simulation, and related efforts for quantitative validation of cross sections and other physical parameters relevant to PIXE simulation.
- OSTI ID:
- 22116970
- Journal Information:
- AIP Conference Proceedings, Vol. 1525, Issue 1; Conference: 22. international conference on application of accelerators in research and industry, Ft. Worth, TX (United States), 5-10 Aug 2012; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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