Monte Carlo simulation applied in total reflection x-ray fluorescence: Preliminary results

Journal Article · Mon May 06 00:00:00 EDT 2013 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4804085· OSTI ID:22111968

Meira, Luiza L. C.; Inocente, Guilherme F.; Vieira, Leticia D.; Mesa, Joel ^[1]

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1. Departamento de Fisica e Biofisica - Instituto de Biociencias de Botucatu, Universidade Estadual Paulista Julio de Mesquita Filho (Brazil)

The X-ray Fluorescence (XRF) analysis is a technique for the qualitative and quantitative determination of chemical constituents in a sample. This method is based on detection of the characteristic radiation intensities emitted by the elements of the sample, when properly excited. A variant of this technique is the Total Reflection X-ray Fluorescence (TXRF) that utilizes electromagnetic radiation as excitation source. In total reflection of X-ray, the angle of refraction of the incident beam tends to zero and the refracted beam is tangent to the sample support interface. Thus, there is a minimum angle of incidence at which no refracted beam exists and all incident radiation undergoes total reflection. In this study, we evaluated the influence of the energy variation of the beam of incident x-rays, using the MCNPX code (Monte Carlo NParticle) based on Monte Carlo method.

• OSTI ID: 22111968
• Journal Information: AIP Conference Proceedings, Vol. 1529, Issue 1; Conference: 35. Brazilian workshop on nuclear physics, Sao Paulo (Brazil), 2-6 Sep 2012; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
43 PARTICLE ACCELERATORS
COMPUTERIZED SIMULATION
EMISSION SPECTRA
EXCITATION
INTERFACES
M CODES
MONTE CARLO METHOD
PHOTON BEAMS
QUANTITATIVE CHEMICAL ANALYSIS
REFLECTION
REFRACTION
VARIATIONS
X RADIATION
X-RAY DETECTION
X-RAY FLUORESCENCE ANALYSIS
X-RAY SPECTRA