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Title: X-ray imaging crystal spectroscopy for use in plasma transport research

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.4758281· OSTI ID:22093981
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  1. MIT-Plasma Science and Fusion Center, Cambridge, Massachusetts 02139 (United States)
  2. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543 (United States)

This research describes advancements in the spectral analysis and error propagation techniques associated with x-ray imaging crystal spectroscopy (XICS) that have enabled this diagnostic to be used to accurately constrain particle, momentum, and heat transport studies in a tokamak for the first time. Doppler tomography techniques have been extended to include propagation of statistical uncertainty due to photon noise, the effect of non-uniform instrumental broadening as well as flux surface variations in impurity density. These methods have been deployed as a suite of modeling and analysis tools, written in interactive data language (IDL) and designed for general use on tokamaks. Its application to the Alcator C-Mod XICS is discussed, along with novel spectral and spatial calibration techniques. Example ion temperature and radial electric field profiles from recent I-mode plasmas are shown, and the impact of poloidally asymmetric impurity density and natural line broadening is discussed in the context of the planned ITER x-ray crystal spectrometer.

OSTI ID:
22093981
Journal Information:
Review of Scientific Instruments, Vol. 83, Issue 11; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English