Streaked x-ray spectrometer having a discrete selection of Bragg geometries for Omega
Abstract
The streaked x-ray spectrometer (SXS) is used with streak cameras [D. H. Kalantar, P. M. Bell, R. L. Costa, B. A. Hammel, O. L. Landen, T. J. Orzechowski, J. D. Hares, and A. K. L. Dymoke-Bradshaw, in 22nd International Congress on High-Speed Photography and Photonics, edited by D. L. Paisley and A. M. Frank (SPIE, Bellingham, WA, 1997), Vol. 2869, p. 680] positioned with a ten-inch manipulator on OMEGA [T. R. Boehly et al., Opt. Commun. 133, 495 (1997)] and OMEGA EP [L. J. Waxer et al., Presented at CLEO/QELS 2008, San Jose, CA, 4-9 May 2008 (Paper JThB1)] for time-resolved, x-ray spectroscopy of laser-produced plasmas in the 1.4- to 20-keV photon-energy range. These experiments require measuring a portion of this photon-energy range to monitor a particular emission or absorption feature of interest. The SXS relies on a pinned mechanical reference system to create a discrete set of Bragg reflection geometries for a variety of crystals. A wide selection of spectral windows is achieved accurately and efficiently using this technique. It replaces the previous spectrometer designs that had a continuous Bragg angle adjustment and required a tedious alignment calibration procedure. The number of spectral windows needed for the SXS wasmore »
- Authors:
-
- Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623-1299 (United States)
- Publication Date:
- OSTI Identifier:
- 22093892
- Resource Type:
- Journal Article
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Volume: 83; Journal Issue: 10; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ABSORPTION; BRAGG REFLECTION; CESR STORAGE RING; EMISSION; EMISSION SPECTRA; LASER-PRODUCED PLASMA; MANIPULATORS; MULTIPARTICLE SPECTROMETERS; PLASMA DIAGNOSTICS; PLASMA PRODUCTION; STREAK CAMERAS; TIME RESOLUTION; X-RAY SPECTRA; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
Citation Formats
Millecchia, M., Regan, S. P., Bahr, R. E., Romanofsky, M., and Sorce, C. Streaked x-ray spectrometer having a discrete selection of Bragg geometries for Omega. United States: N. p., 2012.
Web. doi:10.1063/1.4729501.
Millecchia, M., Regan, S. P., Bahr, R. E., Romanofsky, M., & Sorce, C. Streaked x-ray spectrometer having a discrete selection of Bragg geometries for Omega. United States. https://doi.org/10.1063/1.4729501
Millecchia, M., Regan, S. P., Bahr, R. E., Romanofsky, M., and Sorce, C. 2012.
"Streaked x-ray spectrometer having a discrete selection of Bragg geometries for Omega". United States. https://doi.org/10.1063/1.4729501.
@article{osti_22093892,
title = {Streaked x-ray spectrometer having a discrete selection of Bragg geometries for Omega},
author = {Millecchia, M. and Regan, S. P. and Bahr, R. E. and Romanofsky, M. and Sorce, C.},
abstractNote = {The streaked x-ray spectrometer (SXS) is used with streak cameras [D. H. Kalantar, P. M. Bell, R. L. Costa, B. A. Hammel, O. L. Landen, T. J. Orzechowski, J. D. Hares, and A. K. L. Dymoke-Bradshaw, in 22nd International Congress on High-Speed Photography and Photonics, edited by D. L. Paisley and A. M. Frank (SPIE, Bellingham, WA, 1997), Vol. 2869, p. 680] positioned with a ten-inch manipulator on OMEGA [T. R. Boehly et al., Opt. Commun. 133, 495 (1997)] and OMEGA EP [L. J. Waxer et al., Presented at CLEO/QELS 2008, San Jose, CA, 4-9 May 2008 (Paper JThB1)] for time-resolved, x-ray spectroscopy of laser-produced plasmas in the 1.4- to 20-keV photon-energy range. These experiments require measuring a portion of this photon-energy range to monitor a particular emission or absorption feature of interest. The SXS relies on a pinned mechanical reference system to create a discrete set of Bragg reflection geometries for a variety of crystals. A wide selection of spectral windows is achieved accurately and efficiently using this technique. It replaces the previous spectrometer designs that had a continuous Bragg angle adjustment and required a tedious alignment calibration procedure. The number of spectral windows needed for the SXS was determined by studying the spectral ranges selected by OMEGA users over the last decade. These selections are easily configured in the SXS using one of the 25 discrete Bragg reflection geometries and one of the six types of Bragg crystals, including two curved crystals.},
doi = {10.1063/1.4729501},
url = {https://www.osti.gov/biblio/22093892},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 10,
volume = 83,
place = {United States},
year = {Mon Oct 15 00:00:00 EDT 2012},
month = {Mon Oct 15 00:00:00 EDT 2012}
}