High mass resolution time of flight mass spectrometer for measuring products in heterogeneous catalysis in highly sensitive microreactors
- Department of Physics, Danish National Research Foundation's Center for Individual Nanoparticle Functionality (CINF), Technical University of Denmark, Building 312, DK-2800 Kgs. Lyngby (Denmark)
- Department of Micro- and Nanotechnology, Technical University of Denmark, DTU Nanotech Building 345 East, DK-2800 Kgs. Lyngby (Denmark)
We demonstrate a combined microreactor and time of flight system for testing and characterization of heterogeneous catalysts with high resolution mass spectrometry and high sensitivity. Catalyst testing is performed in silicon-based microreactors which have high sensitivity and fast thermal response. Gas analysis is performed with a time of flight mass spectrometer with a modified nude Bayard-Alpert ionization gauge as gas ionization source. The mass resolution of the time of flight mass spectrometer using the ion gauge as ionization source is estimated to m/{Delta}m > 2500. The system design is superior to conventional batch and flow reactors with accompanying product detection by quadrupole mass spectrometry or gas chromatography not only due to the high sensitivity, fast temperature response, high mass resolution, and fast acquisition time of mass spectra but it also allows wide mass range (0-5000 amu in the current configuration). As a demonstration of the system performance we present data from ammonia oxidation on a Pt thin film showing resolved spectra of OH and NH{sub 3}.
- OSTI ID:
- 22093673
- Journal Information:
- Review of Scientific Instruments, Vol. 83, Issue 7; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
AMMONIA
CATALYSTS
GAS ANALYSIS
GAS CHROMATOGRAPHY
HETEROGENEOUS CATALYSIS
IONIZATION
IONIZATION GAGES
MASS
MASS RESOLUTION
MASS SPECTRA
MASS SPECTROSCOPY
OXIDATION
SENSITIVITY
SILICON
THIN FILMS
TIME-OF-FLIGHT MASS SPECTROMETERS
TIME-OF-FLIGHT METHOD