Effect of high-intensity x-ray radiation on Bragg diffraction in silicon and diamond

Journal Article · Sat Dec 01 00:00:00 EST 2012 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4765719· OSTI ID:22089615

Hau-Riege, Stefan P.; Pardini, Tommaso ^[1]

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1. Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)

We simulated the Bragg reflection of high-intensity short x-ray pulses from single-crystal silicon and diamond by coupling tight-binding-molecular dynamics with a simple atomic kinetics model. We found that even when the pulse-averaged Bragg intensity degrades significantly, the reflectivity drops only slightly at the beginning of the pulse until the lattice is disordered by non-thermal melting. These results suggest that Bragg reflectors could produce shortened x-ray pulses through temporal slicing.

• OSTI ID: 22089615
• Journal Information: Journal of Applied Physics, Vol. 112, Issue 11; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BRAGG REFLECTION
COUPLING
DIAMONDS
MOLECULAR DYNAMICS METHOD
MONOCRYSTALS
SEMICONDUCTOR MATERIALS
SILICON
SIMULATION
X RADIATION
X-RAY DIFFRACTION