Sensitivity in X-ray grating interferometry on compact systems

Journal Article · Tue Jul 31 00:00:00 EDT 2012 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4742307· OSTI ID:22069174

Thuering, Thomas; Modregger, Peter; Haemmerle, Stefan; Weiss, Stephan; Nueesch, Joachim; Stampanoni, Marco ^[1]

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1. Swiss Light Source, Paul Scherrer Institut, Villigen PSI (Switzerland) and Institute for Biomedical Engineering, Swiss Federal Institute of Technology, Zurich (Switzerland)

The optimization of compact X-ray grating interferometry systems is crucial for the progress of this technique in industrial devices. Here, an analytical formulation for the sensitivity of the phase contrast image acquisition is derived using previous results from noise analyses. Furthermore, experimental measurements of the sensitivity for different configurations are compared, providing further insight into the dependence on polychromatic radiation. Finally, strategies for the geometrical optimization are given.

• OSTI ID: 22069174
• Journal Information: AIP Conference Proceedings, Vol. 1466, Issue 1; Conference: International workshop on X-ray and neutron phase imaging with gratings, Tokyo (Japan), 5-7 Mar 2012; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DIFFRACTION GRATINGS
IMAGE PROCESSING
IMAGES
INTERFEROMETERS
INTERFEROMETRY
NOISE
OPTIMIZATION
SENSITIVITY
VISIBLE RADIATION
X RADIATION
X-RAY TUBES