Heterogeneous clusters as a model system for the study of ionization dynamics within tampered samples
- Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron, Notkestrasse 85, D-22607 Hamburg (Germany)
- Hamburger Synchrotronstrahlungslabor, Deutsches Elektronen-Synchrotron, Notkestrasse 85, D-22607 Hamburg (Germany)
- Linac Coherent Light Source, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States)
- Institut fuer Optik und Atomare Physik, Technische Universitaet Berlin, D-10623 Berlin, Hardenbergstrasse 36 (Germany)
Tampering of a sample with a layer of another material is a promising technique to slow down the expansion dynamics within laser irradiated samples, with sound implications for single-particle diffraction imaging. Ideally, if an imaged object is covered by a layer of another material, during the irradiation this layer will be primarily ionized and will expand fast due to Coulomb repulsion, whereas the object located within the net neutral core will expand more slowly (hydrodynamically). We investigate the details of the electronic damage within the tampered samples during their irradiation with an intense extreme ultraviolet (EUV) pulse. We study heterogeneous clusters composed of noble gas atoms, Xe and Ar, for which chemical-bond effects can be neglected. Using a fully nonequilibrium kinetic equation code, we demonstrate the influence of cluster composition on ionization dynamics; in particular, on the electronic damage. The results are obtained for the wavelength of 32 nm, which is available at the free-electron laser in Hamburg (FLASH) facility, but our conclusions can also have implications for samples with a more complex structure and irradiated at a much shorter wavelength.
- OSTI ID:
- 22068719
- Journal Information:
- Physical Review. A, Vol. 84, Issue 3; Other Information: (c) 2011 American Institute of Physics; Country of input: Syrian Arab Republic; ISSN 1050-2947
- Country of Publication:
- United States
- Language:
- English
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