Refractive index gradient measurement across the thickness of a dielectric film by the prism coupling method

Journal Article · Fri Aug 31 00:00:00 EDT 2012 · Quantum Electronics (Woodbury, N.Y.)

DOI:https://doi.org/10.1070/QE2012V042N08ABEH014849· OSTI ID:22066670

Sokolov, Viktor I; Panchenko, Vladislav Ya; Seminogov, V N ^[1]

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1. Institute of Laser and Information Technologies, Russian Academy of Sciences, Troitsk, Moscow Region (Russian Federation)

A method is proposed for measuring the refractive index gradient n(z) in nonuniformly thick dielectric films. The method is based on the excitation of waveguide modes in a film using the prism coupling technique and on the calculation of n(z) and film thickness H{sub f} with the help of the angular positions of the TE or TM modes. The method can be used for an arbitrary shape of the index modulation over the film thickness in the limit of a small gradient [{Delta} n(z)/n(z) || 1]. (laser applications and other topics in quantum electronics)

• OSTI ID: 22066670
• Journal Information: Quantum Electronics (Woodbury, N.Y.), Vol. 42, Issue 8; Other Information: Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7818
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
DIELECTRIC MATERIALS
EXCITATION
MODULATION
QUANTUM ELECTRONICS
REFRACTIVE INDEX
THICKNESS
THIN FILMS
WAVEGUIDES