Development of a graphite polarization analyzer for resonant inelastic x-ray scattering
- Department of Physics, Western Michigan University, Kalamazoo, Michigan 49008-5252 (United States)
- Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Resonant inelastic x-ray scattering (RIXS) is a powerful technique for studying electronic excitations in correlated electron systems. Current RIXS spectrometers measure the changes in energy and momentum of the photons scattered by the sample. A powerful extension of the RIXS technique is the measurement of the polarization state of the scattered photons which contains information about the symmetry of the excitations. This long-desired addition has been elusive because of significant technical challenges. This paper reports the development of a new diffraction-based polarization analyzer which discriminates between linear polarization components of the scattered photons. The double concave surface of the polarization analyzer was designed as a good compromise between energy resolution and throughput. Such a device was fabricated using highly oriented pyrolytic graphite for measurements at the Cu K-edge incident energy. Preliminary measurements on a CuGeO{sub 3} sample are presented.
- OSTI ID:
- 22066280
- Journal Information:
- Review of Scientific Instruments, Vol. 82, Issue 11; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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