Deformation-induced {alpha}{sub 2} {yields} {gamma} phase transformation in TiAl alloys
- Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016 (China)
- Hong Kong Polytechnic University, Hung Hom, Kowloon (Hong Kong)
- Institute of Information Science and Engineering, Central South University, Changsha 410083 (China)
Deformation-induced {alpha}{sub 2} {yields} {gamma} phase transformation in high Nb containing TiAl alloys was investigated using high-resolution transmission electron microscopy (HREM) and energy dispersive X-ray spectroscopy (EDS). The dislocations appearing at the tip of deformation-induced {gamma} plate (DI-{gamma}) and the stacking sequence change of the {alpha}{sub 2} matrix were two key evidences for determining the occurrence of the deformation-induced {alpha}{sub 2} {yields} {gamma} phase transformation. Compositional analysis revealed that the product phase of the room-temperature transformation was not standard {gamma} phase; on the contrary, the product phase of the high-temperature transformation was standard {gamma} phase.
- OSTI ID:
- 22066227
- Journal Information:
- Materials Characterization, Vol. 61, Issue 11; Other Information: Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
- Country of Publication:
- United States
- Language:
- English
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