A simple route to the synthesis of single crystalline copper metagermanate nanowires

Journal Article · Tue Dec 15 00:00:00 EST 2009 · Materials Characterization

DOI:https://doi.org/10.1016/J.MATCHAR.2009.07.005· OSTI ID:22066164

Zhao, H S ^[1]; Tan, W ^[2]; Yu, H Y ^[1]; Chen, Y W ^[3]; Qianfeng, Zhang; Fan, C G ^[1]

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1. School of Materials Science and Engineering, Institute of Molecular Engineering and Applied Chemistry, Key Lab of Materials Science and Processing of Anhui Province, Anhui University of Technology, Ma'anshan, Anhui 243002 (China)
2. Henkel Huawei Electronics Co. Ltd., Lian'yungang, Jiangsu 222006 (China)
3. Department of Materials Science, Fudan University, Shanghai 200433 (China)

Single crystalline copper metagermanate (CuGeO{sub 3}) nanowires with the diameter of 30-300 nm and length of longer than 100 {mu}m have been prepared by a simple hydrothermal deposition route. X-ray diffraction (XRD), selected area electron diffraction (SAED), high-resolution transmission electron microscopy (HRTEM) and Raman analyses confirm that the nanowires are orthorhombic single crystals with a main growth direction along <101>. Room temperature photoluminescence (PL) measurement shows a strong blue emission peak at 442 nm with a broad emission band. The blue emission may be ascribed to radiative recombination of oxygen vacancies and oxygen-germanium vacancies. The formation process of CuGeO{sub 3} nanowires is also discussed.

• OSTI ID: 22066164
• Journal Information: Materials Characterization, Vol. 60, Issue 12; Other Information: Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
77 NANOSCIENCE AND NANOTECHNOLOGY
COPPER COMPOUNDS
CRYSTAL GROWTH
DEPOSITION
ELECTRON DIFFRACTION
GERMANATES
GERMANIUM
MONOCRYSTALS
ORTHORHOMBIC LATTICES
OXYGEN
PHOTOLUMINESCENCE
QUANTUM WIRES
RECOMBINATION
SYNTHESIS
TEMPERATURE RANGE 0273-0400 K
TRANSMISSION ELECTRON MICROSCOPY
VACANCIES
X-RAY DIFFRACTION