Synthesis and characterization of an electro-deposited polyaniline-bismuth telluride nanocomposite - A novel thermoelectric material
- Department of Physics, Bengal Engineering and Science University, Shibpur, Howrah-711 103 (India)
- Tata Steel Ltd., Jamshedpur (India)
- DRDO, Ministry of Defence (India)
- Department of Chemical Engineering, Jadavpur University, Kolkata-700 032 (India)
The present work consists of synthesis and characterization of a novel thermoelectric material polyaniline (PANI)-bismuth telluride (Bi{sub 2}Te{sub 3}) nanocomposite using simultaneous electrochemical reactions and deposition method. The inorganic bismuth nitrate has been used as a dopant for polyaniline to achieve high electrical conductivity. A semi-batch mode of operation has been employed to control the rate of deposition of an individual component and thus the molecular architecture of the composite. The electro-deposited composite film on ITO coated glass substrate has been characterized by X-ray diffraction analysis (XRD), FTIR analysis, scanning electron microscope (SEM), and transmission electron microscope (TEM). The microscopic analysis reveals the formation of rod-like nanostructures of diameter less than 100 nm. It has been found that smaller molecules of Bi{sub 2}Te{sub 3} are dispersed in the macromolecules of PANI. The nanocomposite has been characterized by thermoelectric power.
- OSTI ID:
- 22066163
- Journal Information:
- Materials Characterization, Vol. 60, Issue 12; Other Information: Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
77 NANOSCIENCE AND NANOTECHNOLOGY
BISMUTH NITRATES
BISMUTH TELLURIDES
COMPOSITE MATERIALS
ELECTRIC CONDUCTIVITY
ELECTROCHEMISTRY
ELECTRODEPOSITION
FOURIER TRANSFORMATION
INFRARED SPECTRA
NANOSTRUCTURES
SCANNING ELECTRON MICROSCOPY
SUBSTRATES
SYNTHESIS
THERMOELECTRIC MATERIALS
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION