Single crystalline ZnO nanorods grown by a simple hydrothermal process
- School of Materials Science and Engineering, Institute of Molecular Engineering and Applied Chemistry, Key Lab of Materials Science and Processing of Anhui Province, Anhui University of Technology, Ma'anshan, Anhui 243002 (China)
- Henkel Huawei Electronics Co. Ltd., Lian'yungang, Jiangsu 222006 (China)
- Department of Materials Science, Fudan University, Shanghai 200433 (China)
Single crystalline ZnO nanorods with wurtzite structure have been prepared by a simple hydrothermal process. The microstructure and composition of the products were studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), high-resolution TEM, energy dispersive X-ray spectrum (EDS) and Raman spectrum. The nanorods have diameters ranging from 100 nm to 800 nm and length of longer than 10 {mu}m. Raman peak at 437.8 cm{sup -1} displays the characteristic peak of wurtzite ZnO. Photoluminescence (PL) spectrum shows a blue light emission at 441 nm, which is related to radiative recombination of photo-generated holes with singularly ionized oxygen vacancies.
- OSTI ID:
- 22066131
- Journal Information:
- Materials Characterization, Vol. 60, Issue 9; Other Information: Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
- Country of Publication:
- United States
- Language:
- English
Similar Records
Hydrothermal growth and characterization of vertically well-aligned and dense ZnO nanorods on glass and silicon using a simple optimizer system
Structural, optical and gas sensing properties of vertically well-aligned ZnO nanowires grown on graphene/Si substrate by thermal evaporation method
Related Subjects
77 NANOSCIENCE AND NANOTECHNOLOGY
CRYSTAL GROWTH
HOLES
MICROSTRUCTURE
MONOCRYSTALS
NANOSTRUCTURES
OXYGEN
PHOTOLUMINESCENCE
RAMAN SPECTRA
RECOMBINATION
SCANNING ELECTRON MICROSCOPY
SEMICONDUCTOR MATERIALS
TRANSMISSION ELECTRON MICROSCOPY
VACANCIES
X-RAY DIFFRACTION
X-RAY SPECTRA
ZINC OXIDES