Low energy Fe{sup +} beam irradiation to C{sub 60} thin film

Journal Article · Wed Feb 15 00:00:00 EST 2012 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3675456· OSTI ID:22063851

Minezaki, H; Yoshida, Y ^[1]; Oshima, K ^[1]; Uchida, T ^[2]; Muramatsu, M; Kitagawa, A ^[3]; Asaji, T ^[4]; Kato, Y ^[5]; Biri, S ^[6]

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1. Graduate School of Engineering, Toyo University, 2100, Kujirai, Kawagoe-shi, Saitama 350-8585 (Japan)
2. Bio-Nano Electronics Research Centre, Toyo University, 2100, Kujirai, Kawagoe-shi, Saitama 350-8585 (Japan)
3. National Institute of Radiological Sciences (NIRS), 4-9-1 Anagawa, Inage-ku, Chiba-shi, Chiba 263-8555 (Japan)
4. Tateyama Machine Co., Ltd., 30 Shimonoban, Toyama-shi, Toyama 930-1305 (Japan)
5. Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita-shi, Osaka 565-0871 (Japan)
6. Institute of Nuclear Research (ATOMKI), H-4026 Debrecen, Bem Ter 18/c (Hungary)

We have developed an electron cyclotron resonance ion source apparatus, which is designed for the production of endohedral fullerene. In this study, we irradiated the Fe{sup +} beam to the C{sub 60} thin film. We changed the experimental condition of the dose and the ion energy. We could observe the Fe + C{sub 60} peak by analysis of the time-of-flight mass spectrometry. The highest intensity of the Fe + C{sub 60} peak was observed at the ion energy of 200 eV. The Fe + C{sub 60} peak intensity tended to become high in the case of long irradiation time and large dose.

• OSTI ID: 22063851
• Journal Information: Review of Scientific Instruments, Vol. 83, Issue 2; Conference: ICIS 2011: 14. international conference on ion sources, Giardini-Naxos, Sicily (Italy), 12-16 Sep 2011; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ECR ION SOURCES
EV RANGE
FULLERENES
ION BEAMS
IRON IONS
IRRADIATION
MASS SPECTROSCOPY
PEAKS
RADIATION EFFECTS
THIN FILMS
TIME-OF-FLIGHT SPECTROMETERS