Broadband microwave spectroscopy in Corbino geometry at {sup 3}He temperatures

Journal Article · Wed Feb 15 00:00:00 EST 2012 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3680576· OSTI ID:22063801

Steinberg, Katrin; Scheffler, Marc; Dressel, Martin ^[1]

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1. 1. Physikalisches Institut, Universitaet Stuttgart, 70550 Stuttgart (Germany)

A broadband microwave spectrometer has been constructed to determine the complex conductivity of thin metal films at frequencies from 45 MHz to 20 GHz working in the temperature range from 0.45 K to 2 K (in a {sup 3}He cryostat). The setup follows the Corbino approach: a vector network analyzer measures the complex reflection coefficient of a microwave signal hitting the sample as termination of a coaxial transmission line. As the calibration of the setup limits the achievable resolution, we discuss the sources of error hampering different types of calibration. Test measurements of the complex conductivity of a heavy-fermion material demonstrate the applicability of the calibration procedures.

• OSTI ID: 22063801
• Journal Information: Review of Scientific Instruments, Vol. 83, Issue 2; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CALIBRATION
COAXIAL CABLES
CRYOSTATS
ELECTRIC CONDUCTIVITY
FERMIONS
GHZ RANGE
METALS
MHZ RANGE
MICROWAVE RADIATION
REFLECTION
RESOLUTION
SPECTROSCOPY
TEMPERATURE RANGE 0000-0013 K
THIN FILMS