Note: Vector reflectometry in a beam waveguide

Journal Article · Mon Aug 15 00:00:00 EDT 2011 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3622522· OSTI ID:22063706

Eimer, J R; Bennett, C L ^[1]; Chuss, D T; Wollack, E J ^[2]

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1. Department of Physics and Astronomy, Johns Hopkins University, Baltimore, Maryland 21218 (United States)
2. NASA Goddard Space Flight Center, Code 665, Greenbelt, Maryland 20771 (United States)

We present a one-port calibration technique for characterization of beam waveguide components with a vector network analyzer. This technique involves using a set of known delays to separate the responses of the instrument and the device under test. We demonstrate this technique by measuring the reflected performance of a millimeter-wave variable-delay polarization modulator.

• OSTI ID: 22063706
• Journal Information: Review of Scientific Instruments, Vol. 82, Issue 8; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BEAMS
CALIBRATION
EQUIPMENT
PERFORMANCE
POLARIZATION
REFLECTION
WAVEGUIDES