A time-of-flight backscattering spectrometer at the Spallation Neutron Source, BASIS

Journal Article · Mon Aug 15 00:00:00 EDT 2011 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3626214· OSTI ID:22063705

Mamontov, E; Herwig, K W ^[1]

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1. Neutron Scattering Science Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

We describe the design and current performance of the backscattering silicon spectrometer (BASIS), a time-of-flight backscattering spectrometer built at the spallation neutron source (SNS) of the Oak Ridge National Laboratory (ORNL). BASIS is the first silicon-based backscattering spectrometer installed at a spallation neutron source. In addition to high intensity, it offers a high-energy resolution of about 3.5 {mu}eV and a large and variable energy transfer range. These ensure an excellent overlap with the dynamic ranges accessible at other inelastic spectrometers at the SNS.

• OSTI ID: 22063705
• Journal Information: Review of Scientific Instruments, Vol. 82, Issue 8; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
43 PARTICLE ACCELERATORS
BACKSCATTERING
DESIGN
ENERGY RESOLUTION
ENERGY TRANSFER
EV RANGE
NEUTRON SOURCES
ORNL
SILICON
SPALLATION
TIME-OF-FLIGHT METHOD
TIME-OF-FLIGHT SPECTROMETERS