Study of dithiol monolayer as the interface for controlled deposition of gold nanoparticles
- Department of Materials Technology and Chemistry, University of Lodz, Pomorska 163, 90-236 Lodz (Poland)
- Department of Solid State Physics, University of Lodz, Pomorska 149/153, 90-236 Lodz (Poland)
Self-assembled monolayer of dithiol molecules, deposited on polycrystalline Au (111), prepared at room atmosphere, was studied using scanning tunneling microscopy (STM) and X-ray photoelectron spectroscopy (XPS). Dithiols were used as interface, which chemically bonds to the deposited gold nanoparticles through strong covalent bonds. The size and size distribution of the deposited nanoparticles were measured using dynamic light scattering (DLS), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The AFM results showed that nanoparticles are immobilized and stable during scanning procedure and do not contaminate the AFM tip. The size of monodisperse nanoparticles obtained from the DLS measurements is slightly higher than that obtained from the AFM and SEM measurements. This is due to the fact that the DLS measures the hydrodynamic radius, dependent on the protective chemical layer on nanoparticles. - Research Highlights: {yields} Dithiols molecules create chemically bounded layers on a Au (111) surface. {yields} Gold nanoparticles can be chemically bounded to a self-assembled monolayer. {yields} Nanoparticles are stable during AFM probe interactions.
- OSTI ID:
- 22063668
- Journal Information:
- Materials Characterization, Vol. 62, Issue 3; Other Information: Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
77 NANOSCIENCE AND NANOTECHNOLOGY
ATOMIC FORCE MICROSCOPY
CHEMICAL BONDS
CRYSTAL STRUCTURE
DEPOSITION
DITHIOLS
GOLD
INTERFACES
LAYERS
LIGHT SCATTERING
MOLECULES
NANOSTRUCTURES
PARTICLES
POLYCRYSTALS
SCANNING ELECTRON MICROSCOPY
SCANNING TUNNELING MICROSCOPY
SURFACES
X-RAY PHOTOELECTRON SPECTROSCOPY