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Title: X-ray microtomography

Journal Article · · Materials Characterization
 [1];  [2];  [3]
  1. Department of Civil and Environmental Engineering, University of Maine, 5711 Boardman Hall, Orono, Maine 04469 (United States)
  2. Department of Materials Science and Engineering, Northwestern University (United States)
  3. (United States)

In this tutorial, we describe X-ray microtomography as a technique to nondestructively characterize material microstructure in three dimensions at a micron level spatial resolution. While commercially available laboratory scale instrumentation is available, we focus our attention on synchrotron-based systems, where we can exploit a high flux, monochromatic X-ray beam to produce high fidelity three-dimensional images. A brief description of the physics and the mathematical analysis behind the technique is followed by example applications to specific materials characterization problems, with a particular focus on the utilization of three-dimensional image processing that can be used to extract a wide range of useful information.

OSTI ID:
22063635
Journal Information:
Materials Characterization, Vol. 61, Issue 12; Other Information: Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
Country of Publication:
United States
Language:
English