Five-element Johann-type x-ray emission spectrometer with a single-photon-counting pixel detector

Journal Article · Wed Jun 15 00:00:00 EDT 2011 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3600452· OSTI ID:22062369

Kleymenov, Evgeny; Bokhoven, Jeroen A. van ^[1]; David, Christian; Janousch, Markus; Studer, Marco; Willimann, Markus; Bergamaschi, Anna; Henrich, Beat; Nachtegaal, Maarten ^[1]; Glatzel, Pieter ^[2]; Alonso-Mori, Roberto ^[3]

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1. Paul Scherrer Institut, 5232 Villigen (Switzerland)
2. European Synchrotron Radiation Facility, 6 Rue Jules Horowitz, 38043 Grenoble (France)
3. SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States)

A Johann-type spectrometer with five spherically bent crystals and a pixel detector was constructed for a range of hard x-ray photon-in photon-out synchrotron techniques, covering a Bragg-angle range of 60 deg. - 88 deg. The spectrometer provides a sub emission line width energy resolution from sub-eV to a few eV and precise energy calibration, better than 1.5 eV for the full range of Bragg angles. The use of a pixel detector allows fast and easy optimization of the signal-to-background ratio. A concentration detection limit below 0.4 wt% was reached at the Cu K{alpha}{sub 1} line. The spectrometer is designed as a modular mobile device for easy integration in a multi-purpose hard x-ray synchrotron beamline, such as the SuperXAS beamline at the Swiss Light Source.

• OSTI ID: 22062369
• Journal Information: Review of Scientific Instruments, Vol. 82, Issue 6; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
43 PARTICLE ACCELERATORS
BRAGG REFLECTION
CALIBRATION
CRYSTALS
EMISSION SPECTROSCOPY
ENERGY RESOLUTION
EV RANGE
HARD X RADIATION
LINE WIDTHS
OPTIMIZATION
PHOTONS
SENSITIVITY
SIGNAL-TO-NOISE RATIO
SWISS LIGHT SOURCE
SYNCHROTRONS
X-RAY SPECTROMETERS