Deconvolution of Thomson scattering temperature profiles

Journal Article · Sun May 15 00:00:00 EDT 2011 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3581230· OSTI ID:22062322

Scannell, R; Beurskens, M; Carolan, P G; Kirk, A; Walsh, M ^[1]; O'Gorman, T ^[2]; Osborne, T H ^[3]

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1. EURATOM/CCFE Fusion Association, Culham Science Centre, Abingdon, Oxfordshire, OX14 3DB (United Kingdom)
2. Department of Physics, University College Cork, Cork (Ireland)
3. General Atomics, P.O. Box, San Diego, California 92186-5608 (United States)

Deconvolution of Thomson scattering (TS) profiles is required when the gradient length of the electron temperature (T{sub e}) or density (n{sub e}) are comparable to the instrument function length ({Delta}{sub R}). The most correct method for deconvolution to obtain underlying T{sub e} and n{sub e} profiles is by consideration of scattered signals. However, deconvolution at the scattered signal level is complex since it requires knowledge of all spectral and absolute calibration data. In this paper a simple technique is presented where only knowledge of the instrument function I(r) and the measured profiles, T{sub e,observed}(r) and n{sub e,observed}(r), are required to obtain underlying T{sub e}(r) and n{sub e}(r). This method is appropriate for most TS systems and is particularly important where high spatial sampling is obtained relative to {Delta}{sub R}.

• OSTI ID: 22062322
• Journal Information: Review of Scientific Instruments, Vol. 82, Issue 5; Other Information: (c) 2011 EURATOM; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CALIBRATION
ELECTRON DENSITY
ELECTRON TEMPERATURE
SIGNALS
TEMPERATURE MEASUREMENT
THOMSON SCATTERING