Spatially resolved high-resolution x-ray spectroscopy of high-current plasma-focus discharges

Journal Article · Fri Oct 15 00:00:00 EDT 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3483190· OSTI ID:22058725

ZajaPc, S; Rzadkiewicz, J; Scholz, M; Paduch, M; Zielinska, E ^[1]; Rosmej, O; Yongtao, Zhao ^[2]; Gojska, A ^[3]

---

1. Institute of Plasma Physics and Laser Microfusion (IPPLM), Hery 23, 01-497 Warsaw (Poland)
2. Gesellschaft fuer Schwerionenforschung (GSI), Planckstrasse 1, 64291 Darmstadt (Germany)
3. Andrzej Soltan Institute for Nuclear Studies, 05-400 Swierk (Poland)

Soft x-ray emission from a Mather-type plasma-focus device (PF-1000) operated at {approx}400 kJ was measured. The high density and temperature plasma were generated by the discharge in the deuterium-argon gas mixture in the modified (high-current) plasma-focus configuration. A spherically bent mica crystal spectrograph viewing the axial output of the pinch region was used to measure the x-ray spectra. Spatially resolved spectra including the characteristic x-ray lines of highly ionized Ar and continua were recorded by means of an x-ray film. The x-ray emission of PF-1000 device was studied at different areas of the pinch.

• OSTI ID: 22058725
• Journal Information: Review of Scientific Instruments, Vol. 81, Issue 10; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ARGON
CRYSTALS
DEUTERIUM
ELECTRIC DISCHARGES
FILMS
HOT PLASMA
MICA
PF-1000 DEVICE
PINCH EFFECT
PLASMA DENSITY
PLASMA FOCUS
SOFT X RADIATION
SPATIAL RESOLUTION
X-RAY EMISSION ANALYSIS
X-RAY SPECTRA
X-RAY SPECTROSCOPY