Development of two-channel prototype ITER vacuum ultraviolet spectrometer with back-illuminated charge-coupled device and microchannel plate detectors

Journal Article · Fri Oct 15 00:00:00 EDT 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3478550· OSTI ID:22055887

Seon, C R; Choi, S H; Cheon, M S; Pak, S; Lee, H G ^[1]; Biel, W ^[2]; Barnsley, R ^[3]

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1. National Fusion Research Institute, Gwahangno 113, Yuseong-gu, Daejeon 305-333 (Korea, Republic of)
2. Institut fuer Plasmaphysik, Forschungszentrum Juelich Gmbh, D-52425 Juelich (Germany)
3. ITER Organization, CS 90 046, 13067 St. Paul Lez Durance Cedex (France)

A vacuum ultraviolet (VUV) spectrometer of a five-channel spectral system is designed for ITER main plasma impurity measurement. To develop and verify the system design, a two-channel prototype system is fabricated with No. 3 (14.4-31.8 nm) and No. 4 (29.0-60.0 nm) among the five channels. The optical system consists of a collimating mirror to collect the light from source to slit, two holographic diffraction gratings with toroidal geometry, and two different electronic detectors. For the test of the prototype system, a hollow cathode lamp is used as a light source. To find the appropriate detector for ITER VUV system, two kinds of detectors of the back-illuminated charge-coupled device and the microchannel plate electron multiplier are tested, and their performance has been investigated.

• OSTI ID: 22055887
• Journal Information: Review of Scientific Instruments, Vol. 81, Issue 10; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
CHARGE-COUPLED DEVICES
COLLIMATORS
DIFFRACTION GRATINGS
FAR ULTRAVIOLET RADIATION
FLUORESCENT LAMPS
HOLLOW CATHODES
HOLOGRAPHY
ITER TOKAMAK
LIGHT SOURCES
MICROCHANNEL ELECTRON MULTIPLIERS
OPTICAL SYSTEMS
PLASMA IMPURITIES
ULTRAVIOLET SPECTROMETERS
VISIBLE RADIATION