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Title: 2D electron cyclotron emission imaging at ASDEX Upgrade (invited)

Abstract

The newly installed electron cyclotron emission imaging diagnostic on ASDEX Upgrade provides measurements of the 2D electron temperature dynamics with high spatial and temporal resolution. An overview of the technical and experimental properties of the system is presented. These properties are illustrated by the measurements of the edge localized mode and the reversed shear Alfven eigenmode, showing both the advantage of having a two-dimensional (2D) measurement, as well as some of the limitations of electron cyclotron emission measurements. Furthermore, the application of singular value decomposition as a powerful tool for analyzing and filtering 2D data is presented.

Authors:
 [1]; ;  [2]; ; ; ;  [1]; ; ;  [3];  [2];  [4];  [5];  [6]
  1. Max Planck Institut fuer Plasmaphysik, 85748 Garching (Germany)
  2. FOM-Institute for Plasma Physics, Rijnhuizen, 3430 BE Nieuwegein (Netherlands)
  3. University of California at Davis, Davis, California 95616 (United States)
  4. Eindhoven University of Technology, 5600 MB Eindhoven (Netherlands)
  5. POSTECH, Pohang, Gyeongbuk, 790-784 (Korea, Republic of)
  6. University of Colorado, Boulder, Colorado 80309 (United States)
Publication Date:
OSTI Identifier:
22055831
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 81; Journal Issue: 10; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ALFVEN WAVES; ASDEX TOKAMAK; CYCLOTRONS; EDGE LOCALIZED MODES; EIGENFREQUENCY; ELECTRON EMISSION; ELECTRON TEMPERATURE; MEASURING METHODS; REVERSED SHEAR; TIME RESOLUTION

Citation Formats

Classen, I G. J., FOM-Institute for Plasma Physics, Rijnhuizen, 3430 BE Nieuwegein, Boom, J E, Vries, P C. de, Suttrop, W, Schmid, E, Garcia-Munoz, M, Schneider, P A, Tobias, B, Domier, C W, Luhmann, Jr, N C, Donne, A J. H., Eindhoven University of Technology, 5600 MB Eindhoven, Jaspers, R J. E., Park, H K, and Munsat, T. 2D electron cyclotron emission imaging at ASDEX Upgrade (invited). United States: N. p., 2010. Web. doi:10.1063/1.3483214.
Classen, I G. J., FOM-Institute for Plasma Physics, Rijnhuizen, 3430 BE Nieuwegein, Boom, J E, Vries, P C. de, Suttrop, W, Schmid, E, Garcia-Munoz, M, Schneider, P A, Tobias, B, Domier, C W, Luhmann, Jr, N C, Donne, A J. H., Eindhoven University of Technology, 5600 MB Eindhoven, Jaspers, R J. E., Park, H K, & Munsat, T. 2D electron cyclotron emission imaging at ASDEX Upgrade (invited). United States. https://doi.org/10.1063/1.3483214
Classen, I G. J., FOM-Institute for Plasma Physics, Rijnhuizen, 3430 BE Nieuwegein, Boom, J E, Vries, P C. de, Suttrop, W, Schmid, E, Garcia-Munoz, M, Schneider, P A, Tobias, B, Domier, C W, Luhmann, Jr, N C, Donne, A J. H., Eindhoven University of Technology, 5600 MB Eindhoven, Jaspers, R J. E., Park, H K, and Munsat, T. 2010. "2D electron cyclotron emission imaging at ASDEX Upgrade (invited)". United States. https://doi.org/10.1063/1.3483214.
@article{osti_22055831,
title = {2D electron cyclotron emission imaging at ASDEX Upgrade (invited)},
author = {Classen, I G. J. and FOM-Institute for Plasma Physics, Rijnhuizen, 3430 BE Nieuwegein and Boom, J E and Vries, P C. de and Suttrop, W and Schmid, E and Garcia-Munoz, M and Schneider, P A and Tobias, B and Domier, C W and Luhmann, Jr, N C and Donne, A J. H. and Eindhoven University of Technology, 5600 MB Eindhoven and Jaspers, R J. E. and Park, H K and Munsat, T},
abstractNote = {The newly installed electron cyclotron emission imaging diagnostic on ASDEX Upgrade provides measurements of the 2D electron temperature dynamics with high spatial and temporal resolution. An overview of the technical and experimental properties of the system is presented. These properties are illustrated by the measurements of the edge localized mode and the reversed shear Alfven eigenmode, showing both the advantage of having a two-dimensional (2D) measurement, as well as some of the limitations of electron cyclotron emission measurements. Furthermore, the application of singular value decomposition as a powerful tool for analyzing and filtering 2D data is presented.},
doi = {10.1063/1.3483214},
url = {https://www.osti.gov/biblio/22055831}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 10,
volume = 81,
place = {United States},
year = {Fri Oct 15 00:00:00 EDT 2010},
month = {Fri Oct 15 00:00:00 EDT 2010}
}