A tangentially viewing fast ion D-alpha diagnostic for NSTX

Journal Article · Fri Oct 15 00:00:00 EDT 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3495768· OSTI ID:22055807

Bortolon, A; Heidbrink, W W ^[1]; Podesta, M ^[2]

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1. University of California, Irvine, California 92697 (United States)
2. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543 (United States)

A second fast ion D-alpha (FIDA) installation is planned at NSTX to complement the present perpendicular viewing FIDA diagnostics. Following the present diagnostic scheme, the new diagnostic will consist of two instruments: a spectroscopic diagnostic that measures fast ion spectra and profiles at 16 radial points with 5-10 ms resolution and a system that uses a band pass filter and photomultiplier to measure changes in FIDA light with 50 kHz sampling rate. The new pair of FIDA instruments will view the heating beams tangentially. The viewing geometry minimizes spectral contamination by beam emission or edge sources of background emission. The improved velocity-space resolution will provide detailed information about neutral-beam current drive and about fast ion acceleration and transport by injected radio frequency waves and plasma instabilities.

• OSTI ID: 22055807
• Journal Information: Review of Scientific Instruments, Vol. 81, Issue 10; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BEAM CURRENTS
BEAMS
EMISSION
ION SPECTROSCOPY
IONS
KHZ RANGE
NSTX DEVICE
PLASMA DIAGNOSTICS
PLASMA HEATING
PLASMA INSTABILITY
RADIOWAVE RADIATION
VISIBLE RADIATION