Influence of process parameters on rolling-contact-fatigue life of ion plated nickel-copper-silver lubrication

Journal Article · Tue May 15 00:00:00 EDT 2012 · Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films

DOI:https://doi.org/10.1116/1.3693603· OSTI ID:22054158

Danyluk, Mike; Dhingra, Anoop ^[1]

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1. Department of Mechanical Engineering, University of Wisconsin-Milwaukee, Milwaukee, Wisconsin 53211-3029 (United States)

In this paper, we present a connection between argon ion flux, element-mixing, and rolling contact fatigue (RCF) life of a thin film nickel-copper-silver lubricant on ball bearings. The film is deposited on the balls using an ion plating process and tested for RCF in high vacuum. The ion flux is measured using a Langmuir probe and the plane stress within the film during deposition is calculated using a thin film model. Experiments reveal that there is an inverse relationship between ion flux and RCF life for most deposition voltage and pressure combinations tested, specifically, 15.5-18.5 mTorr and 1.5-3.5 kV. For voltages up to 2.5 kV, RCF life decreases as ion flux increases due to increased compressive stress within the film, reaching as high as 2.6 GPa. For voltages between 2.5 and 3.5 kV, interlayer mixing of nickel and copper with the silver layer reduces RCF life due to contamination, even as ion flux and corresponding film compressive stress are reduced. A Monte Carlo-based simulation tool, SRIM is used to track collision cascades of the argon ions and metal atoms within the coating layers. At process voltages above 2.5 kV we observe elemental mixing of copper and nickel with the silver layer using Auger electron spectroscopy of coated steel and Si{sub 3}N{sub 4} balls. The authors conclude that an ion flux greater than 5.0 x 10{sup 14} cm{sup -2} s{sup -1} leads to reduced RCF life due to high film stress. In addition, process voltages greater than 2.5 kV also reduce RCF life due to contamination and interlayer mixing of nickel and copper within the silver layer.

• OSTI ID: 22054158
• Journal Information: Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films, Vol. 30, Issue 3; Other Information: (c) 2012 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1553-1813
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ARGON IONS
AUGER ELECTRON SPECTROSCOPY
BALL BEARINGS
COPPER
COPPER BASE ALLOYS
FATIGUE
LANGMUIR PROBE
LUBRICANTS
MONTE CARLO METHOD
NICKEL
NICKEL ALLOYS
ROLLING
SILICON NITRIDES
SILVER
SILVER ALLOYS
STEELS
STRESSES
THIN FILMS