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Title: A simple hard x-ray ''nanoslit'' for measuring wavefront intensity

Abstract

A new method is proposed for nanoscale hard x-ray measurements. This method uses a reflection on a heavy-metal wire that functions as a single slit with a nanoscale aperture for a parallel x-ray beam. This ''nanoslit'' can be used to perform high-spatial-resolution measurements of the intensity distribution of a wavefront that diverges from an aperture. In experiments, Fresnel fringes generated by a rectangular aperture were measured using a 300-{mu}m-diameter platinum wire as the nanoslit. In these experiments, the finest fringes with a period of 26 nm could be successfully resolved.

Authors:
; ; ; ; ;  [1]
  1. Graduate School of Material Science, University of Hyogo, Kouto 3-2-1, Hyogo 678-1297 (Japan)
Publication Date:
OSTI Identifier:
22053791
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 81; Journal Issue: 7; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 77 NANOSCIENCE AND NANOTECHNOLOGY; APERTURES; FRESNEL REFLECTORS; HARD X RADIATION; HEAVY METALS; NANOSTRUCTURES; PHOTON BEAMS; PLATINUM; REFLECTION; SPATIAL RESOLUTION; WAVE PROPAGATION; WIRES

Citation Formats

Takano, Hidekazu, Hashimoto, Takuto, Tsuji, Takuya, Koyama, Takahisa, Tsusaka, Yoshiyuki, and Kagoshima, Yasushi. A simple hard x-ray ''nanoslit'' for measuring wavefront intensity. United States: N. p., 2010. Web. doi:10.1063/1.3456447.
Takano, Hidekazu, Hashimoto, Takuto, Tsuji, Takuya, Koyama, Takahisa, Tsusaka, Yoshiyuki, & Kagoshima, Yasushi. A simple hard x-ray ''nanoslit'' for measuring wavefront intensity. United States. https://doi.org/10.1063/1.3456447
Takano, Hidekazu, Hashimoto, Takuto, Tsuji, Takuya, Koyama, Takahisa, Tsusaka, Yoshiyuki, and Kagoshima, Yasushi. 2010. "A simple hard x-ray ''nanoslit'' for measuring wavefront intensity". United States. https://doi.org/10.1063/1.3456447.
@article{osti_22053791,
title = {A simple hard x-ray ''nanoslit'' for measuring wavefront intensity},
author = {Takano, Hidekazu and Hashimoto, Takuto and Tsuji, Takuya and Koyama, Takahisa and Tsusaka, Yoshiyuki and Kagoshima, Yasushi},
abstractNote = {A new method is proposed for nanoscale hard x-ray measurements. This method uses a reflection on a heavy-metal wire that functions as a single slit with a nanoscale aperture for a parallel x-ray beam. This ''nanoslit'' can be used to perform high-spatial-resolution measurements of the intensity distribution of a wavefront that diverges from an aperture. In experiments, Fresnel fringes generated by a rectangular aperture were measured using a 300-{mu}m-diameter platinum wire as the nanoslit. In these experiments, the finest fringes with a period of 26 nm could be successfully resolved.},
doi = {10.1063/1.3456447},
url = {https://www.osti.gov/biblio/22053791}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 7,
volume = 81,
place = {United States},
year = {Thu Jul 15 00:00:00 EDT 2010},
month = {Thu Jul 15 00:00:00 EDT 2010}
}