First results obtained from the soft x-ray pulse height analyzer on experimental advanced superconducting tokamak

Journal Article · Tue Jun 15 00:00:00 EDT 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3443572· OSTI ID:22053756

Xu, P; Lin, S Y; Hu, L Q; Duan, Y M; Zhang, J Z; Chen, K Y; Zhong, G Q ^[1]

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1. Institute of Plasma Physics, Chinese Academy of Sciences, P.O. Box 1126, Hefei 230031 (China)

An assembly of soft x-ray pulse height analyzer system, based on silicon drift detector (SDD), has been successfully established on the experimental advanced superconducting tokamak (EAST) to measure the spectrum of soft x-ray emission (E=1-20 keV). The system, including one 15-channel SDD linear array, is installed on EAST horizontal port C. The time-resolved radial profiles of electron temperature and K{sub {alpha}} intensities of metallic impurities have been obtained with a spatial resolution of around 7 cm during a single discharge. It was found that the electron temperatures derived from the system are in good agreement with the values from Thomson scattering measurements. The system can also be applied to the measurement of the long pulse discharge for EAST. The diagnostic system is introduced and some typical experimental results obtained from the system are also presented.

• OSTI ID: 22053756
• Journal Information: Review of Scientific Instruments, Vol. 81, Issue 6; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ELECTRIC DISCHARGES
ELECTRON TEMPERATURE
EMISSION SPECTRA
HT-7U TOKAMAK
IMPURITIES
KEV RANGE
PULSES
SI SEMICONDUCTOR DETECTORS
SOFT X RADIATION
SPATIAL RESOLUTION
THOMSON SCATTERING
TIME RESOLUTION
X-RAY EMISSION ANALYSIS
X-RAY SPECTRA