Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers
Abstract
This note outlines a calibration method for atomic force microscope friction measurement that uses the ''pivot'' method of [Bogdanovic et al., Colloids Surf. B 19, 397 (2000)] to generate optical lever sensitivities for known torque applied to rectangular cantilevers. We demonstrate the key calibration parameter to be a linear function of the position at which it is determined along the length of the cantilevers. In this way the optical lever system can be calibrated for cantilever torque by applying loads at locations along the length of a cantilever, away from the integrated tip, so that issues such as tip damage or interference can be avoided.
- Authors:
-
- Materials Science and Engineering Laboratory, National Institute of Standards and Technology, 100 Bureau Dr. Gaithersburg, Maryland 20899 (United States)
- Publication Date:
- OSTI Identifier:
- 22053647
- Resource Type:
- Journal Article
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Volume: 81; Journal Issue: 2; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ATOMIC FORCE MICROSCOPY; CALIBRATION; FRICTION; LENGTH; SENSITIVITY; TORQUE
Citation Formats
Chung, Koo-Hyun, and Reitsma, Mark G. Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers. United States: N. p., 2010.
Web. doi:10.1063/1.3276709.
Chung, Koo-Hyun, & Reitsma, Mark G. Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers. United States. https://doi.org/10.1063/1.3276709
Chung, Koo-Hyun, and Reitsma, Mark G. 2010.
"Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers". United States. https://doi.org/10.1063/1.3276709.
@article{osti_22053647,
title = {Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers},
author = {Chung, Koo-Hyun and Reitsma, Mark G},
abstractNote = {This note outlines a calibration method for atomic force microscope friction measurement that uses the ''pivot'' method of [Bogdanovic et al., Colloids Surf. B 19, 397 (2000)] to generate optical lever sensitivities for known torque applied to rectangular cantilevers. We demonstrate the key calibration parameter to be a linear function of the position at which it is determined along the length of the cantilevers. In this way the optical lever system can be calibrated for cantilever torque by applying loads at locations along the length of a cantilever, away from the integrated tip, so that issues such as tip damage or interference can be avoided.},
doi = {10.1063/1.3276709},
url = {https://www.osti.gov/biblio/22053647},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 2,
volume = 81,
place = {United States},
year = {Mon Feb 15 00:00:00 EST 2010},
month = {Mon Feb 15 00:00:00 EST 2010}
}
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