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Title: Absolute response of Fuji imaging plate detectors to picosecond-electron bunches

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.3284524· OSTI ID:22053614
; ; ; ; ;  [1]; ;  [2]; ;  [3]
  1. Forschungszentrum Dresden-Rossendorf (FZD), Dresden 01314 (Germany)
  2. TU Dresden, OncoRay-Radiation Research in Oncology, Dresden 01307 (Germany)
  3. Heinrich-Heine Universitaet Duesseldorf, Duesseldorf 40225 (Germany)

The characterization of the absolute number of electrons generated by laser wakefield acceleration often relies on absolutely calibrated FUJI imaging plates (IP), although their validity in the regime of extreme peak currents is untested. Here, we present an extensive study on the dependence of the sensitivity of BAS-SR and BAS-MS IP to picosecond electron bunches of varying charge of up to 60 pC, performed at the electron accelerator ELBE, making use of about three orders of magnitude of higher peak intensity than in prior studies. We demonstrate that the response of the IPs shows no saturation effect and that the BAS-SR IP sensitivity of 0.0081 photostimulated luminescence per electron number confirms surprisingly well data from previous works. However, the use of the identical readout system and handling procedures turned out to be crucial and, if unnoticed, may be an important error source.

OSTI ID:
22053614
Journal Information:
Review of Scientific Instruments, Vol. 81, Issue 1; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English