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Title: Emittance characterization of a hot-cavity laser ion source at Holifield Radioactive Ion Beam Facility

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.3184343· OSTI ID:22051015
; ; ; ; ; ; ;  [1]; ; ; ; ;  [2]
  1. Physics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)
  2. Institut fuer Physik, Johannes Gutenberg-Universitaet Mainz, D-55099 Mainz (Germany)

The first investigation of the transverse emittance of a hot-cavity laser ion source based on all-solid-state Ti:sapphire lasers is presented. The emittances of {sup 63}Cu ion beams generated by three-photon resonant ionization are measured and compared with that of the {sup 69}Ga and {sup 39}K ion beams resulting from surface ionization in the same ion source. A self-consistent unbiased elliptical exclusion method is adapted for noise reduction and emittance analysis. Typical values of the rms and 90% fractional emittances of the Cu ion beams at 20 keV energy are found to be about 2 and 8 {pi} mm mrad, respectively, for the ion currents of 2-40 nA investigated. The emittances of the laser-produced Cu ion beams are smaller than those of the surface-ionized Ga and K ion beams.

OSTI ID:
22051015
Journal Information:
Review of Scientific Instruments, Vol. 80, Issue 8; Other Information: (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English