Degradations to microprocessor-based systems due to environmental stressors
- Ohio State Univ., 201 West 19th Ave., Columbus, OH 43210 Idaho National Laboratory, P.O. Box 1625, Idaho Falls, ID 83415 (United States)
Recent studies indicate that EMI/RFI is the most significant environmental Stressor with potential for leading to digital systems degradation and failure. With digital I and C and wireless technology becoming standard in many industrial environments, nuclear power plant operators of current and future plants will or already have implemented these technologies seeking to leverage the economic benefits of such technology. With digital I and C systems' higher susceptibility to EMI/RFI and the increased environmental noise introduced by wireless-based systems, this produces a dangerous combination that could lead to logic errors, equipment damage, and faults in digital I and C. Failures to these systems, especially to safety-critical systems, could lead to loss of system, which would pose a safety risk and decrease in operational efficiency. In order to better understand system degradations by these means and aid in regulation and guidance, we propose to experimentally study the susceptibility of digital I and C to wireless technology. (authors)
- Research Organization:
- American Nuclear Society, 555 North Kensington Avenue, La Grange Park, IL 60526 (United States)
- OSTI ID:
- 22030115
- Resource Relation:
- Conference: NPIC and HMIT 2006: 5. International Topical Meeting on Nuclear Plant Instrumentation Controls, and Human Machine Interface Technology, Albuquerque, NM (United States), 12-16 Nov 2006; Other Information: Country of input: France; 29 refs.; Related Information: In: Proceedings of the 5. International Topical Meeting on Nuclear Plant Instrumentation Controls, and Human Machine Interface Technology| 1430 p.
- Country of Publication:
- United States
- Language:
- English
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