Single atom identification by energy dispersive x-ray spectroscopy

Journal Article · Mon Apr 09 00:00:00 EDT 2012 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.3701598· OSTI ID:22025519

Lovejoy, T C; Dellby, N; Krivanek, O L ^[1]; Ramasse, Q M ^[2]; Falke, M; Kaeppel, A; Terborg, R ^[3]; Zan, R ^[4]

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1. Nion, 1102 8th St., Kirkland, Washington 98033 (United States)
2. SuperSTEM Laboratory, STFC Daresbury, Keckwick Lane, Daresbury WA4 4AD (United Kingdom)
3. Bruker Nano GmbH, Schwarzschildstr. 12, 12489 Berlin (Germany)
4. School of Physics and Astronomy, University of Manchester, Manchester M13 9PL (United Kingdom)

Using aberration-corrected scanning transmission electron microscope and energy dispersive x-ray spectroscopy, single, isolated impurity atoms of silicon and platinum in monolayer and multilayer graphene are identified. Simultaneously acquired electron energy loss spectra confirm the elemental identification. Contamination difficulties are overcome by employing near-UHV sample conditions. Signal intensities agree within a factor of two with standardless estimates.

• OSTI ID: 22025519
• Journal Information: Applied Physics Letters, Vol. 100, Issue 15; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
77 NANOSCIENCE AND NANOTECHNOLOGY
ATOMS
ELECTRONS
ENERGY-LOSS SPECTROSCOPY
GRAPHITE
LAYERS
PLATINUM
SCANNING ELECTRON MICROSCOPY
SEMICONDUCTOR MATERIALS
SILICON
TRANSMISSION ELECTRON MICROSCOPY
X RADIATION
X-RAY SPECTROSCOPY