Polarity-dependent photoemission spectra of wurtzite-type zinc oxide
- International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba 305-0044 (Japan)
- Synchrotron X-ray Station at SPring-8, NIMS, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan)
- NIMS Saint-Gobain Center of Excellence for Advanced Materials, NIMS, 1-1 Namiki, Tsukuba 305-0044 (Japan)
- Optical and Electronic Materials Unit, NIMS, 1-1 Namiki, Tsukuba 305-0044 (Japan)
- Department of Materials Chemistry, Graduate School of Engineering, Hosei University, 3-7-2 Kajino-cho, Koganei, Tokyo 184-8584 (Japan)
The polar surfaces of wurtzite-type zinc oxide (ZnO) were characterized by x-ray photoemission spectroscopy to identify the origin of the polarity dependence of the valence band spectra. A characteristic sub-peak always appeared in the valence band spectra of the (0001) face regardless of the surface preparation conditions. It also appeared in the valence band spectra of the (1012) face, but only when the photoelectron take-off angle was parallel to the c-axis of ZnO. Our analysis demonstrates that this take-off angle dependency originates not from the surface state, photoelectron diffraction, or the presence of surfactants but from the crystal polarity.
- OSTI ID:
- 22025422
- Journal Information:
- Applied Physics Letters, Vol. 100, Issue 5; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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